Test analytics
Visualize Variation at the Silicon Level.
A dedicated page for the v2 visualization layer: capability, lot-to-lot trends, failure concentration, live yield pulse, and a sandbox that simulates the full data-to-chart workflow.
Test analytics
Visual analytics built for test engineers.
Review distributions, capability, lot-to-lot behavior and failure concentration in one analytical surface.
Process capability
Cp / Cpk Gauge
CP
1.68
CPK
1.54
OOS
0.31%
Cross-test comparison
Multi-Lot Pass / Fail Trend
● L2408● L2409● L2410
Failure concentration
Defect Pareto · Site / Head
Live visualization
Real-Time Yield Pulse
STREAMINGSynthetic demo telemetry
Live analytics stream
Distribution and Die Scatter
Updated continuously from synthetic test telemetry
Histogram · Current (mA)hover bins
Die scatter · Site / Resulthover points
Statistical snapshot
Test 27
Yield97.8%
Mean42.18 mA
3σ spread1.26 mA
OOS events22
AI signal
Site 03 is contributing disproportionately to the upper-tail outliers. Compare Head 2 against Head 4 before escalating.
INTERACTIVE PRODUCT DEMO
Load sample STDF. Watch intelligence appear.
Give customers a hands-on preview of the workflow: ingest test data, parse records, generate distributions, calculate capability and expose failure concentration.
STREAM PROCESSOR
READY0records
Sample: wafer_test_L2410.stdf
TESTS0
DIE0
PASS—
OOS—
› Waiting for sample data...
DISTRIBUTION
Current (mA)
FAILURE CONCENTRATION