LIVE TEST STREAM AI ANALYSIS READY MULTI-TENANT SaaS / PaaS
Cloud-native semiconductor test intelligence

Semiconductor Big Test Data Analytics, Powered by AI.

Transform raw STDF and CSV files into interactive yield dashboards in seconds. Stop wrestling with manual data and let AI highlight your process variations.

No credit card required to start. Secure multi-tenant workspace
01
Ingest & manage
STDF/CSV native ingestion with workflow tracking.
02
Explore variation
Cp/Cpk, lot, site, head, and device drill-down analysis.
03
Measure yield
Yield, sigma, OOS, min/max, and capability metrics.
04
Ask AI
Engineering copilot for focused root-cause insights.
3D SILICON INTELLIGENCE
Interactive Wafer Failure Map
LIVE DIE ANALYSIS
L2410-B2 · W12
PASS 96.8% · OOS 3.2%
Move cursor to inspect dieAI focus · Site 03
● AI signal detected · Site 03
↗ Lot-to-lot variation tracked
Live die-level test stream
Test 27 · High-current distribution
PASS 97.8%OOS 2.2%
LIVE ANALYTICS STREAM
Updated just now
Histogram · Current (mA)hover bins
Die scatter · Site / Resulthover points
LOT
L2409-A7
WAFER
W12
SITE
S03
HEAD
H2
From raw data to engineering insight

One intelligent flow. Zero dashboard chaos.

0.0 sec insight loop●streaming demo
STDF / CSV
Ingest
Normalize
Structure
Analyze
Statistics
Visualize
Yield & trends
AI Insight
Actionable report
Feature page

Test Data Analytics

Open the dedicated visualization page for capability, yield trend, pareto, and sandbox-driven analysis demos. Test Data Analytics Cp/Cpk & Pareto Yield Analysis Cp: 1.67 Cpk: 1.24 Etch Via Contam Resist Align STDF Live

Feature page

AI Chat

Explore the AI analytics experience separately with natural-language prompts and engineering-oriented responses. AI Engineering Copilot "Show low-yielding sites for Lot L2409-A7" AI Analysis Complete for Lot L2409-A7: • Site S03 shows an anomaly drop (88.4%). • Root cause isolated to test high-current variables. Site S03 88.4% Yield Site S01 98.2% Yield Site S02 97.9% Yield

Feature page

Operations ERC

See operations intelligence, alerting concepts, and the engineering resource center in a focused page. Operations ERC Real-Time Fab Alerting & Monitors LIVE Critical Variance Detected Lot L2410-B2 • Site 03 • OOS exceeding 3.2% limit threshold Lot-to-Lot Trend Confidence: 97.8% Resource Metrics Ingestion Loop Speed 0.0 sec Active Fab Streams 14 Live

Cloud-native onboarding

Enterprise-Grade SaaS/PaaS Architecture for Every Fab and OSAT.

Set up your secure workspace, assign team roles, and dive straight into test data analytics. Onboarding integrates smoothly with your enterprise setup.

01Company Profile

Create your secure workspace

Capture company profile details and establish an isolated environment for users, imports and reports.

02Role Provisioning

Assign Owner, Admin & User roles

Provision company-level users and admins within configurable account quotas.

03Instant Analytics

Drag in your first STDF file

Move from onboarding to ingestion, processing, statistical analysis and engineering insights.

Drop STDF / CSVDEMO
or click to simulate a 2-second ingestion
Get Started Free