Yield Sentinel
Continuously compare yield, bin behavior and parametric stability against engineering thresholds.
This page combines the v2 operations intelligence section and the engineering resource center into one focused destination.
Continuously compare yield, bin behavior and parametric stability against engineering thresholds.
Prioritize the anomalies that deserve attention and attach the statistical evidence behind each signal.
Bring STDF, CSV and structured test outputs into one analysis workflow, with a guided path for custom formats.
Use interactive examples, analysis recipes and workflow walkthroughs to help test engineers understand how the platform fits into characterization, production debug and yield improvement.
Instead of presenting isolated charts, position every analysis step as part of one operational system—from raw test records to engineering decisions and repeatable reports.
Interactive Test, Site, Head, Device and Lot drill-downs.
Monitor pass/fail, OOS concentration and yield excursions with exception-first views.
Ask natural-language questions and turn statistical patterns into engineering explanations.
Create consistent engineering summaries from the same analysis context and data lineage.
A single experience can move from KPI → anomaly → site/head drill-down → statistical evidence → AI explanation without losing context.