TestsAssuredAI
Semiconductor Platform

AI-Powered Semiconductor Test Data Analytics and Intelligent Reporting

TestsAssuredAI converts STDF and CSV data into interactive dashboards, statistical insights, AI-assisted analysis, and actionable engineering reports.

Flagship Product

AI-powered chip data analytic tool

This platform combines BI dashboards, conversational AI analytics, and automated reporting to transform how semiconductor teams interact with test data.

  • Import high-volume STDF and CSV files with centralized workflow management.
  • Generate interactive visuals and automated statistical summaries for Test, Site, Head, Device, and Lot views.
  • Translate raw data into engineering-focused recommendations and actionable insight.

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AI-powered chip data analytics visual
Core Platform Features

Combined brochure features with product capabilities

Data ingestion flow for semiconductor test files

Data Ingestion and Management

Import large-volume STDF and CSV data with centralized management, status tracking, and automated data-to-analysis flow.

  • Supports wafer sort, final test, DFT, burn-in, and reliability datasets.
  • Tracks ingestion state for faster operations and audit clarity.
Interactive histogram and local test analytics dashboard

Interactive Test Analytics

Use BI dashboards with filters and drill-down controls to compare tests, sites, heads, and devices in detail.

  • Histogram overlays and compare mode for side-by-side test behavior.
  • Built for production diagnostics and engineering investigations.
Yield summary and distribution insights dashboard

Statistical and Yield Quality Analysis

Automatically compute mean, standard deviation, min/max ranges, out-of-spec signals, and pass/fail yield metrics.

  • Immediate yield and failure-rate visibility per selected scope.
  • Faster stability checks and variation tracking across production data.
AI chat assisted semiconductor insights

AI-Powered Semiconductor Intelligence

Ask natural-language questions such as yield performance and variation hotspots to get instant visual and text-based responses.

  • AI-generated engineering insights for skewness, anomalies, and cross-parameter variation.
  • Deep multi-dimensional comparison across Test, Site, Head, Device, and Lot.
Automated Workflow

From raw test data to final engineering report

Data Ingestion (STDF/CSV) -> Processing -> Statistical Analysis -> Histograms and Visualization -> Yield/Quality Analysis -> AI Interpretation -> Engineering Insights -> Final Report.

  • Integrated with Amazon QuickSight for BI views and AI-assisted exploration.
  • Designed to reduce manual reporting effort while increasing analysis speed.
  • Scalable multi-tenant architecture for large semiconductor test operations.
Why Choose TestsAssuredAI

Combined value from brochure and current release announcement

Accelerate Investigations

Identify quality, variation, and yield issues quickly through guided analytics and dashboard-level visibility.

Reduce Manual Effort

Automate analysis and report generation so teams can focus on high-impact engineering decisions.

Actionable Intelligence

Convert high-volume tester output into understandable conclusions and practical recommendations.

Highly Scalable

Built for large-scale semiconductor test environments with robust ingestion and reporting throughput.

Product release assets

Tests Assured AI launched TA-Chat-Agent to streamline semiconductor test reporting and strengthen quality decision workflows.

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